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Browsing by Author "Malagi, Santosh"

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    Application of cell-aware test on an advanced 3nm CMOS standard-cell library

    Gao, Zhan  
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    Hu, Min-Chun
    ;
    Marinissen, Erik Jan  
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    Malagi, Santosh
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    Swenton, Joe
    ;
    Huisken, Jos
    Proceedings paper
    2019-05, CDNLive EMEA 2019, 6/05/2019
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    Application of cell-aware test on an advanced 3nm CMOS technology library

    Gao, Zhan  
    ;
    Hu, Min-Chun
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    Baert, Rogier  
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    Chehab, Bilal  
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    Malagi, Santosh
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    Swenton, Joe
    ;
    Huisken, Jos
    Proceedings paper
    2019-11, IEEE International Test Conference (ITC'19), 12/11/2019, p.1-6
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    Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology

    Gao, Zhan  
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    Hu, Min-Chun
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    Baert, Rogier  
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    Chehab, Bilal  
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    Swenton, Joe
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    Malagi, Santosh
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    Huisken, Jos
    Journal article
    2024, IEEE DESIGN & TEST, (41) 2, p.56-64
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    Defect-location identification for cell-aware test

    Gao, Zhan  
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    Malagi, Santosh
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    Marinissen, Erik Jan  
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    Swenton, Joe
    ;
    Huisken, Jos
    ;
    Goossens, Kees
    Proceedings paper
    2019-03, IEEE Latin-American Test Symposium (LATS'19), 11/03/2019, p.1-6
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    Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

    Gao, Zhan  
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    Hu, Min-Chun
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    Malagi, Santosh
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    Swenton, Joe
    ;
    Huisken, Jos
    ;
    Goossens, Kees
    Journal article
    2021-04-01, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, (37) 2, p.161-189
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    Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis

    Lorenzelli, Francesco  
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    Gao, Zhan  
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    Swenton, Joe
    ;
    Malagi, Santosh
    ;
    Marinissen, Erik Jan  
    Proceedings paper
    2021, 26th IEEE European Test Symposium (ETS), MAY 24-28, 2021
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    Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults

    Hu, Min-Chun
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    Gao, Zhan  
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    Malagi, Santosh
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    Swenton, Joe
    ;
    Huisken, Jos
    ;
    Goossens, Kees
    ;
    Wu, Cheng-Wen
    Proceedings paper
    2020, 25th IEEE European Test Symposium (ETS), MAY 25-29, 2020

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