Browsing by Author "Martin Martinez, Javier"

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Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

Amat, Esteve
;
Rodriguez, Rosana
;
Bargallo Gonzalez, Mireia
;
Martin Martinez, Javier
Proceedings paper
2010, IEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 1/11/2010
Processing dependences of CHC degradation on strained-Si pMOSFETs

Amat, Esteve
;
Martin Martinez, Javier
;
Bargallo Gonzalez, Mireia
;
Rodriguez, Rosana
Meeting abstract
2010, 16th Workshop on Dielectrics in Microelectronics - WoDIM, 28/06/2010
SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

Martin Martinez, Javier
;
Amat, Esteve
;
Bargallo Gonzalez, Mireia
;
Verheyen, Peter
Journal article
2010, Microelectronics Reliability, (50) 9_11, p.1263-1266