Browsing by Author "Masin, F."
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Publication Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs
Publication ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping
; Banerjee, A.Journal article2019, Microelectronics Reliability, 100, p.113334Publication μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
Proceedings paper2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019