Browsing by Author "Merkulov, Alex"

Determining the carbon detection limit with magnetic sector dynamic secondary ion mass spectrometry (SIMS)

Determining the oxygen detection limit with magnetic sector dynamic secondary ion mass spectrometry (SIMS)

Epitaxial Si/SiGe Multi-Stacks: From Stacked Nano-Sheet to Fork-Sheet and CFET Devices

Improvement of carbon depth profiling within shallow structures by secondary ion mass spectrometry (SIMS)

Non-uniform Gd distribution and magnetization profiles within GdCoFe alloy thin films

"Non-uniform Gd distribution and magnetization profiles within GdCoFe alloy thin films" (vol 123, 122403 2023)

NPN SiGe Hetero Junction Transistor Latch-Up Memory Selector

OrbiSIMS depth profiling of semiconductor materials-Useful yield and depth resolution

Ultralow impact energy dynamic secondary ion mass spectrometry with nonfully oxidizing surface conditions