Browsing by Author "Michl, Jakob"
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Publication Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Journal article2023, MICROELECTRONICS RELIABILITY, (146) July, p.Art. 115004Publication Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental
Journal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 12, p.6372-6378Publication Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory
Journal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 12, p.6365-6371Publication Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Journal article2023, IEEE TRANSACTIONS ON NANOTECHNOLOGY, 22, p.590-596