Browsing by Author "Mitterbauer, F."
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Publication 3D TCAD model for poly-Si channel current and variability in vertical NAND flash memory
Proceedings paper2019, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 4/09/2019Publication Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
Publication Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021