imec Institutional Repository Browsing {{ collection }} by Author "Morena, E."

Publication

Characterization and modeling of transient device behavior under CDM ESD stress

Willemen, J.

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Andreini, A.

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De Heyn, Vincent

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Esmark, K.

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Etherton, M.

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Gieser, H.

Proceedings paper

2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.88-97

Publication

Characterization and modeling of transient device behavior under CMD ESD stress

Willemen, J.

;

Andreini, A.

;

De Heyn, Vincent

;

Esmark, K.

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Etherton, M.

;

Gieser, H.

Journal article

2004, Journal of Electrostatics, (62) 2_3, p.133-153

Publication

Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Stadler, W.

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Esmark, K.

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Reynders, K.

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Zubeidat, M.

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Graf, M.

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Wilkening, W.

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Willemen, J.

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Qu, D.

Journal article

2005, Microelectronics Reliability, (45) 2, p.269-277

Publication

Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Stadler, Wolfgang

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Esmark, K.

;

Reynders, K.

;

Zuhbeidat, M.

;

Graf, M.

;

Wilkening, W.

;

Willemen, J.

Proceedings paper

2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.319-327

Browsing by Author "Morena, E."