Browsing by Author "Mukherjee, K."
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Publication Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors
Journal article2022, MICROELECTRONICS RELIABILITY, (138) November, p.Art. 114620Publication Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs
; ; ; Proceedings paper2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022Publication Study and characterization of GaN MOS capacitors: Planar vs trench topographies
Journal article2022, APPLIED PHYSICS LETTERS, (120) 14, p.143501