Browsing by Author "Na, Hoon Joo"
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Publication Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Proceedings paper2013, 43rd European Solid-State Device Research Conference - ESSDERC, 16/09/2013, p.190-193Publication Impact of thermal budget on the low-frequency noise of DRAM peripheral nMOSFETs
Proceedings paper2015, China Semiconductor Technology International Conference - CSTIC, 15/03/2015, p.1-4Publication Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Journal article2014, Semiconductor Science and Technology, (29) 11, p.115015Publication Strained c:Si0.55Ge0.45 with Embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications
Journal article2016, Materials Science in Semiconductor Processing, (42) 2, p.255-258