Browsing by Author "Nguyen, Ngoc Duy"
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Publication Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x
Proceedings paper2013-06, 8th International conference on Silicon Epitaxy and Heterostructures - ICSI-8, 2/06/2013, p.65-66Publication Current transients in reverse-biased p-GeSn/n-Ge diodes
Proceedings paper2015, International Conference on Silicon Epitaxy and Heterostructures - ICSI-9, 17/05/2015, p.111-112Publication Electrical activity of threading dislocations and defect complexes in GeSn epitaxial layers
Proceedings paper2013, 8th International Conference on Silicon Epitaxy and Heterostructures - ICSI-8, 2/06/2013, p.63-64Publication Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties (vol 11, 7788, 2021)
Journal article correction2021Publication Integration of III-V on Si for high-mobility CMOS
Proceedings paper2012, International Silicon-Germanium Technology and Device Meeting - ISTDM, 4/06/2012Publication Integration of InGaAs channel n-MOS devices on 200mm Si wafers using the aspect-ratio-trapping technique
Proceedings paper2012, Graphene, Ge/III-V, Nanowires, and Emerging Materials for Post-CMOS Applications 4, 6/05/2012, p.115-128Publication Opto-electronic properties and solar cell efficiency modelling of Cu2ZnXS4 (X = Sn, Ge, Si) kesterites
Journal article2021, JOURNAL OF PHYSICS-ENERGY, (3) 3, p.035005Publication Study of interface trap density in a GeSn MOS structure by numerical simulation of the electrical characteristics
Proceedings paper2013, 8th International conference on Silicon Epitaxy and Heterostructures - ICSI-8, 3/06/2013Publication Theoretical and experimental investigation of the GeSn bandgap
Meeting abstract2013, E-MRS 2013 Fall Meeting, 16/09/2013