Browsing by Author "Nishi, Yoshio"
Now showing 1 - 5 of 5
- Results per page
- Sort Options
Publication Ab initio modeling of oxygen-vacancy formation in doped-HfOx RRAM: effects of oxide phases, stoichiometry and dopant concentrations
Journal article2015, Applied Physics Letters, (107) 1, p.13504Publication Experimental demonstration of high source velocity and its enhancement by uniaxial stress in Ge PFETs
Proceedings paper2010, IEEE Symposium on VLSI Technology, 15/06/2010, p.215-216Publication On the high-field transport and uniaxial stress effect in Ge PFETs
Journal article2011, IEEE Transactions on Electron Devices, (58) 2, p.384-391Publication The effects of VUV radiation on low-k organosilicate glass (SiCOH) as measured with electron-spin resonance
Meeting abstract2015, AVS 62nd International Symposium and Exhibition, 18/10/2015, p.177Publication Theory and experiments of the impact of work function variability on threshold voltage variability in MOS devices
Journal article2012, IEEE Transactions on Electron Devices, (59) 11, p.3124-3126