Browsing by Author "Nistor, L.C."
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Publication Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Proceedings paper2004, Proceedings of the 13th European Microscopy Congress. Volume 2: Materials Sciences, 22/08/2004, p.405-406Publication TEM characterization of extended defects induced in Si wafers by H-plasma treatment
Journal article2007-01, Journal of Physics D: Applied Physics, 40, p.395-400Publication The thermal stability of ALD Zr:Al mixed oxide thin films: an in situ TEM study
Journal article2005-07, Journal of Materials Research, (20) 7, p.1741-1750