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Browsing by Author "Olsen, S.H."

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    1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

    Yan, L.
    ;
    Simoen, Eddy  
    ;
    Olsen, S.H.
    ;
    Akheyar, Amal
    ;
    Claeys, Cor
    ;
    O'Neill, A.G.
    Journal article
    2009, Solid-State Electronics, (53) 11, p.1177-1182
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    Quantifying self-heating effects with scaling in globally strained Si MOSFETS

    Agaiby, R.
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    Yang, Y.
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    Olsen, S.H.
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    O'Neill, A.G.
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    Eneman, Geert  
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    Verheyen, Peter  
    ;
    Loo, Roger  
    Journal article
    2007, Solid-State Electronics, (51) 11_12, p.1473-1478
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    Strained Si/SiGe MOS technology: improving gate dielectric integrity

    Olsen, S.H.
    ;
    Yan, L.
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    Agaiby, R.
    ;
    Escobedo-Cousin, A.G.
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    O'Neil, A.G.
    ;
    Hellstrom, P.E.
    ;
    Ostling, M.
    Journal article
    2009, Microelectronic Engineering, (86) 3, p.218-223
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    Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers

    Escobedo-Cousin, E.
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    Olsen, S.H.
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    Dobrosz, P.
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    Bull, S.J.
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    O'Neill, A.G.
    ;
    Coulson, H.
    ;
    Claeys, Cor
    Journal article
    2007, Journal of Applied Physics, (102) 12, p.123502

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