Browsing by Author "Pace, Calogero"
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Publication Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
;Magnone, Paolo ;Crupi, Felice ;Pantisano, LuigiPace, CalogeroJournal article2007, Applied Physics Letters, (90) 7, p.73507Publication Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Journal article2008, Microelectronic Engineering, (85) 3, p.1728-1731Publication On the impact of defects close to the gate electrode on the low-frequency 1/f noise
;Magnone, Paolo ;Pantisano, Luigi ;Crupi, Felice ;Trojman, Lionel ;Pace, CalogeroGiusi, GinoJournal article2008, IEEE Electron Devices Letters, 29, p.1056-1058