Browsing by Author "Pace, Calogero"
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Publication Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
;Magnone, Paolo ;Crupi, Felice ;Pantisano, LuigiPace, CalogeroJournal article2007-02, Applied Physics Letters, (90) 7, p.73507Publication Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Journal article2008, Microelectronic Engineering, (85) 3, p.1728-1731Publication On the impact of defects close to the gate electrode on the low-frequency 1/f noise
;Magnone, Paolo ;Pantisano, Luigi ;Crupi, Felice ;Trojman, Lionel ;Pace, CalogeroGiusi, GinoJournal article2008-09, IEEE Electron Devices Letters, 29, p.1056-1058