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Browsing by Author "Pace, Calogero"

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    Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise

    Magnone, Paolo
    ;
    Crupi, Felice
    ;
    Pantisano, Luigi
    ;
    Pace, Calogero
    Journal article
    2007-02, Applied Physics Letters, (90) 7, p.73507
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    Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices

    Magnone, Paolo
    ;
    Subramanian, Vaidy
    ;
    Parvais, Bertrand  
    ;
    Mercha, Abdelkarim  
    ;
    Pace, Calogero
    Journal article
    2008, Microelectronic Engineering, (85) 3, p.1728-1731
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    On the impact of defects close to the gate electrode on the low-frequency 1/f noise

    Magnone, Paolo
    ;
    Pantisano, Luigi
    ;
    Crupi, Felice
    ;
    Trojman, Lionel
    ;
    Pace, Calogero
    ;
    Giusi, Gino
    Journal article
    2008-09, IEEE Electron Devices Letters, 29, p.1056-1058

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