Browsing by Author "Pandey, Komal"
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Publication Exploring the impact of confinement in Spreading Resistance Microscopy Analysis
Proceedings paper2017, European Materials Research Fall Meeting, 18/09/2017Publication Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM
Meeting abstract2018, Materials Research Society Spring Meeting 2018, 2/04/2018, p.CM01.09.02Publication Novel metrology for mask degradation: IR-AFM, XPS depth profiling and HAXPES
Publication The impact of Focused Ion Beam (FIB) induced electrical damage on electrical characterization
Meeting abstract2018, European Materials Research Society Spring Meeting Symposium I: Materials Research for Group IV Semiconductors: Growth, Characte, 18/06/2018, p.I.15.2Publication The impact of focused ion beam induced damage on scanning spreading resistance microscopy
Journal article2020, Scientific Reports, 10, p.14893Publication Understanding the effect of confinement in scanning spreading resistance microscopy measurements
Journal article2020, Journal of Applied Physics, (128) 3, p.34303Publication Understanding tip-induced nanoscale wear for tomographic atomic force microscopy
Meeting abstract2019, AVS 66th International Symposium & Exhibition, 20/10/2019, p.NS-ThP8