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Browsing by Author "Pawlowski, G."

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    Optimization of an advanced positive DUV photoresist towards 150 nm and beyond

    Ercken, Monique  
    ;
    Moelants, Myriam  
    ;
    Vandenberghe, Geert  
    ;
    Goethals, Mieke
    ;
    Ronse, Kurt  
    Oral presentation
    1999, MNE'99 - Micro and Nano Engineering Conference
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    Optimization of an advanced positive DUV resist for 248 nm L/S pattern printing

    Ercken, Monique  
    ;
    Pollers, Ingrid
    ;
    Van Puyenbroeck, Ilse
    ;
    Goethals, Mieke
    ;
    Ronse, Kurt  
    Oral presentation
    1998, MNE 98 - Micro- and Nano-Engineering Conference; 22-24 Sept. 1998; Leuven, Belgium.
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    Optimization of an advanced positive DUV resist for 248 nm L/S pattern printing

    Ercken, Monique  
    ;
    Moelants, Myriam  
    ;
    Pollers, Ingrid
    ;
    Van Puyenbroeck, Ilse
    ;
    Goethals, Mieke
    Journal article
    1999, Microelectronic Engineering, (46) 1_4, p.353-357
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    Optimization of an advanced positive tone DUV photoresist towards 150nm and beyond

    Ercken, Monique  
    ;
    Moelants, Myriam  
    ;
    Vandenberghe, Geert  
    ;
    Goethals, Mieke
    ;
    Ronse, Kurt  
    Journal article
    2000, Microelectronic Engineering, (53) 1_4, p.443-447

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