Browsing by Author "Pergoot, A."
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Publication A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Journal article2001, Microelectronics Reliability, (41) 3, p.437-443Publication A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.584-587Publication Modelling hot carrier degradation of LDD NMOSFETs by using a high resolution measurement technique
Journal article1999, Microelectronics and Reliability, (39) 6_7, p.785-790Publication The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines
Journal article1998, Microelectronics Reliability, (38) 1, p.87-98