Browsing by Author "Qu, Xin-Ping"
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Publication A study on (Co1-xNixSi2) Schottky contacts on N-Si(100) substrates
Proceedings paper2001, Semiconductor Technology - ISTC, p.540-548Publication Effective electrical passivation of Ge(100) for HfO2 gate dielectric layers using O2 plasma
Journal article2011, Electrochemical and Solid-State Letters, (14) 5, p.G20-G22Publication Germanium surface passivation and atomic layer deposition of high- k dielectrics - a tutorial review on Ge-based MOS capacitors
; ; ; ; ; ; Qu, Xin-PingJournal article2012, Semiconductor Science and Technology, (27) 7, p.74012Publication Implementing TiO2 as gate dielectric for Ge-channel complementary metal-oxide-semiconductor devices by using HfO2/GeO2 interlayer
Journal article2010, Applied Physics Letters, (97) 11, p.112905Publication Nondestructive characterization of thin silicides using x-ray reflectivity
;Detavernier, C. ;De Gryse, R. ;Van Meirhaeghe, R. L. ;Cardon, F. ;Ru, Guo-PingQu, Xin-PingJournal article2000, J. Vacuum Science and Technology A, (A18) 2, p.470-476Publication TiO2/HfO2 bi-layer gate stacks grown by atomic layer deposition for germanium-based metal-oxide-semiconductor devices using GeOxNy passivation layer
Journal article2011, Electrochemical and Solid-State Letters, (14) 5, p.G27-G30