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Browsing by Author "Reed, R."

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    Development of a resistive memory-based, radiation-hardened cache memory for space flight and mission-critical applications

    Bennett, W.
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    Hooten, N.
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    Schrimpf, R.
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    Reed, R.
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    Alles, M.
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    Zhang, E.X.
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    Weeden-Wright, S.
    Proceedings paper
    2014, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 14/09/2014, p.10-19
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    Dynamic modeling of radiation induced state change in HfO2/Hf 1T1R RRAM

    Linten, Dimitri  
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    Bennett, W.
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    Hooten, N.
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    Schrimpf, R.
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    Reed, R.
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    Alles, M.
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    Zhang, E.X.
    Proceedings paper
    2014, Aerospace Conference, 1/03/2014
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    Laser-induced current transients in bulk FinFETs

    El-Mamouni, F.
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    Zhang, E.X.
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    Hooten, N.
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    Schrimpf, R.D.
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    Reed, R.
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    Galloway, K.F.
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    McMarrow, D.
    Meeting abstract
    2011, Nuclear and Space Radiation Engineering Conference - NSREC, 25/07/2011
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    Pulsed-laser induced single-event transients in InGaAs FinFETs on bulk silicon substrates

    Gong, H.
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    Ni, K.
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    Zhang, E.X.
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    Sternberg, A. L.
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    Kuzub, J.A.
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    Alles, M.L.
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    Reed, R.
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    Fleetwood, D.
    Journal article
    2019, IEEE Transactions on Nuclear Science, (66) 1, p.376-383
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    Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM

    Bennett, W.
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    Hooten, N.
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    Schrimpf, R.
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    Reed, R.
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    Mendenhall, M.H.
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    Alles, M.
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    Bi, J.
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    Zhang, E.
    Journal article
    2014, IEEE Transactions on Nuclear Science, (61) 4, p.1717-1725
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    Total ionizing dose effects on strained Ge pMOS FinFETS on bulk Si

    Zhang, E. Z
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    Fleetwood, D. M.
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    Hatchel, J. A.
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    Liang, C.
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    Reed, R.
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    Alles, M. L.
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    Schrimpf, R. D.
    Journal article
    2017, IEEE Transactions on Nuclear Science, (64) 1, p.226-232
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    Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors

    Gorchichko, Maria
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    Zhang, E.X.
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    Wang, P.
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    Schrimpf, R.
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    Reed, R.
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    Fleetwood, D.M.
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    Bonaldo, S.
    Proceedings paper
    2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.C-4

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