Browsing by Author "Reed, R."
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Publication Development of a resistive memory-based, radiation-hardened cache memory for space flight and mission-critical applications
;Bennett, W. ;Hooten, N. ;Schrimpf, R. ;Reed, R. ;Alles, M. ;Zhang, E.X.Weeden-Wright, S.Proceedings paper2014, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 14/09/2014, p.10-19Publication Dynamic modeling of radiation induced state change in HfO2/Hf 1T1R RRAM
Proceedings paper2014, Aerospace Conference, 1/03/2014Publication Laser-induced current transients in bulk FinFETs
;El-Mamouni, F. ;Zhang, E.X. ;Hooten, N. ;Schrimpf, R.D. ;Reed, R. ;Galloway, K.F.McMarrow, D.Meeting abstract2011, Nuclear and Space Radiation Engineering Conference - NSREC, 25/07/2011Publication Pulsed-laser induced single-event transients in InGaAs FinFETs on bulk silicon substrates
;Gong, H. ;Ni, K. ;Zhang, E.X. ;Sternberg, A. L. ;Kuzub, J.A. ;Alles, M.L. ;Reed, R.Fleetwood, D.Journal article2019, IEEE Transactions on Nuclear Science, (66) 1, p.376-383Publication Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM
;Bennett, W. ;Hooten, N. ;Schrimpf, R. ;Reed, R. ;Mendenhall, M.H. ;Alles, M. ;Bi, J.Zhang, E.Journal article2014, IEEE Transactions on Nuclear Science, (61) 4, p.1717-1725Publication Total ionizing dose effects on strained Ge pMOS FinFETS on bulk Si
;Zhang, E. Z ;Fleetwood, D. M. ;Hatchel, J. A. ;Liang, C. ;Reed, R. ;Alles, M. L.Schrimpf, R. D.Journal article2017, IEEE Transactions on Nuclear Science, (64) 1, p.226-232Publication Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
;Gorchichko, Maria ;Zhang, E.X. ;Wang, P. ;Schrimpf, R. ;Reed, R. ;Fleetwood, D.M.Bonaldo, S.Proceedings paper2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.C-4