Browsing by Author "Sakai, A."
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Publication Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Proceedings paper2010-10, SiGe, Ge, and Related Compounds: Materials, Processing, and Devices, 10/10/2010, p.529-535Publication Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Meeting abstract2010, 218th ECS Meeting, 10/10/2010, p.1909Publication Ge1-xSnx stressors for strained-Ge CMOS
Journal article2011, Solid-State Electronics, (60) 1, p.53-57Publication Use of p- and n-type vapor phase doping and sub-melt laser anneal for extension junctions in sub-32 nm CMOS technology
Journal article2010, Thin Solid Films, (518) 6, Suppl. 1, p.S48-S52Publication X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates
Proceedings paper2010, SiGe, Ge, and related Compounds 4: Materials, Processing and Devices, 10/10/2010, p.887-892Publication X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates
Meeting abstract2010, 218th ECS Fall Meeting, 10/10/2010, p.1946