Browsing by Author "Schryvers, Dominique"
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Publication Characterization of nickel silicides using EELS-based methods
Journal article2010, Journal of Microscopy, (240) 1, p.75-82Publication Characterization of nickel-silicides by HAADF-STEM imaging
Proceedings paper2010, International Microscopy Congress - IMC-17, 19/09/2010Publication Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)
Proceedings paper2008-09, 14th European Microscopy Congress, 1/09/2008, p.455-456Publication Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES
Meeting abstract2009, Microscopy of Semiconducting Materials Conference - MSMXVI, 17/03/2009Publication Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES
Journal article2010, Journal of Physics Conference Series, (209) 1, p.12057Publication Compositional characterization of nickel silicides by HAADF-STEM imaging
Oral presentation2010, E-MRS Symposium Q: Quantitative Electron Microscopy for Research and IndustryPublication Damage in nickel silicides during FIB specimen preparation
Meeting abstract2011, Microscopy of Semiconducting Materials - MSM XVII, 4/04/2011Publication Experimental determination of inelastic mean free paths for calculation of TEM specimen thickness
Meeting abstract2011, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 23/05/2011, p.TU-28