Browsing by Author "Selmi, L."
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Publication Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
Journal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 3, p.1745-1751Publication Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
Journal article2024, SOLID-STATE ELECTRONICS, (215) May, p.Art. 108881Publication Design of ultra-wideband low-noise amplifiers in 45nm CMOS technology: comparison between planar bulk and SOI FinFET devices
Journal article2009, IEEE Transactions on Circuits and Systems I: Regular Papers, (56) 5, p.920-932Publication Design of UWB LNA in 45nm CMOS technology: Planar vs. FinFET
Proceedings paper2008-05, IEEE International Symposium on Circuits and Systems, 18/05/2008, p.2701-2704Publication Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs
Publication Fabrication, characterization and modeling of strained SOI MOSFETs with very large effective mobility
Publication Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
; Publication Impact of high-mobility materials on the performance of near- and sub-threshold CMOS logic circuits
Journal article2013, IEEE Transactions on Electron Devices, (60) 3, p.972-977Publication New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication Polarity dependent charge trapping in thin SiO2/Al2O3 gate staks with poly-Si gate electrodes: influence of high temperature annealing
Oral presentation2002, 33rd IEEE Semiconductor Interface Specialists Conference - SISCPublication Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes
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