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Browsing by Author "Shibin, Konstantin"

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    3D design-for-test architecture

    Marinissen, Erik Jan  
    ;
    Konijnenburg, Mario  
    ;
    Verbree, Jouke
    ;
    Chi, Chun-Chuan
    ;
    Deutsch, Sergej
    Book chapter
    2019-03
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    At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs

    Shibin, Konstantin
    ;
    Chickermane, Vivek
    ;
    Keller, Brion
    ;
    Papameletis, Christos
    Meeting abstract
    2015-05, CDN Live EMEA, 27/04/2015
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    At-Speed delay testing of inter-die connections of 2.5D- and 3D-SICs

    Shibin, Konstantin
    ;
    Chickermane, Vivek
    ;
    Keller, Brion
    ;
    Papameletis, Christos
    Proceedings paper
    2015-05, IEEE North-Atlantic Test Workshop - NATW, 11/05/2015
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    At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs

    Shibin, Konstantin
    ;
    Chickermane, Vivek
    ;
    Keller, Brion
    ;
    Papameletis, Christos
    Proceedings paper
    2015-05, IEEE European Test Symposium - ETS, 25/05/2015
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    At-speed inter-die interconnect test in 2.5D- and 3D-SICs

    Shibin, Konstantin
    ;
    Chickermane, Vivek
    ;
    Keller, Brion
    ;
    Papameletis, Christos
    Proceedings paper
    2015-10, IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST), 8/10/2015
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    At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic

    Shibin, Konstantin
    ;
    Chickermane, Vivek
    ;
    Keller, Brion
    ;
    Papameletis, Christos
    Proceedings paper
    2015-11, IEEE Asian Test Symposium - ATS, 22/11/2015

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