Browsing by Author "Shiv, Lior"
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Publication 3 omega correction method for eliminating resistance measurement error due to Joule heating
Publication Apparent size effects on dopant activation in nanometer-wide Si fins
Journal article2021, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, (39) 2, p.Art. 023202Publication Electrical characterization of single nanometer-wide Si fins in dense arrays
Journal article2018, Beilstein Journal of Nanotechnology, 9, p.1863-1867Publication Towards carrier profiling in nanometer-wide Si fins with micro four-point probe
Proceedings paper2018, 2018 22nd International Conference on Ion Implantation Technology (IIT), 16/09/2018, p.1-3Publication Zero and one-dimensional electrical characterization of nanometer-wide Si fins
Meeting abstract2018, 22nd International Conference on Ion Implantation Technology - IIT, 16/09/2018