Browsing by Author "Stadler, W."
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Publication Characterization and modeling of transient device behavior under CDM ESD stress
Proceedings paper2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.88-97Publication Characterization and modeling of transient device behavior under CMD ESD stress
Journal article2004, Journal of Electrostatics, (62) 2_3, p.133-153Publication Test circuits for fast and reliable assessment if CDM robustness of I/O stages