Browsing by Author "Strakos, Libor"
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Publication Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations
Journal article2020, Ultramicroscopy, 210, p.112928Publication Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling constrast imaging
Proceedings paper2018, SiGe, Ge, and Related Materials: Materials, Processing, and Devices 8, 30/09/2018, p.387-396Publication Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
Journal article2021, MICRON, 150, p.103123Publication Enhancing the defect contrast in ECCI through angular filtering of BSEs
Journal article2020, Ultramicroscopy, 210, p.112922Publication Non-destructive characterization of extended crystalline defects in confined semiconductor device structures
Journal article2018, Nanoscale, (10) 15, p.7058-7066