imec Institutional Repository Browsing {{ collection }} by Author "Thomas, S."

Publication

Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

Simoen, Eddy

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Brouwers, Gijs

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Eneman, Geert

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Bargallo Gonzalez, Mireia

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De Jaeger, Brice

Journal article

2008, Materials Science in Semiconductor Processing, (11) 5_6, p.364-367

Publication

Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs

Serra, N.

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Conzatti, F.

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Esseni, D.

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De Michielis, M.

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Palestri, P.

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Selmi, L.

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Thomas, S.

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Whall, T. E.

Proceedings paper

2009, IEEE International Electron Devices Meeting - IEDM, 7/12/2009, p.71-74

Publication

Factors influencing the leakage current in embedded SiGe source/drain junctions

Simoen, Eddy

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Bargallo Gonzalez, Mireia

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Vissouvanadin Soubaretty, Bertrand

Journal article

2008, IEEE Transactions on Electron Devices, (55) 3, p.925-930

Publication

Improved thermal stability of Ni-silicides on Si:C epitaxial layers

Machkaoutsan, Vladimir

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Mertens, Sofie

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Bauer, R.

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Lauwers, Anne

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Verheyden, Kurt

Journal article

2007, Microelectronic Engineering, 84, p.2542-2546

Publication

Thermal stability of Pt and C-doped NiSi films

Machkaoutsan, Vladimir

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Pagès, X.

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Bauer, M.

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Thomas, S.

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Mertens, Sofie

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Verheyden, K.

Proceedings paper

2007, 15th IEEE Conference on Advanced Thermal Processing of Semiconductors - RTP, 2/10/2007, p.145-149

Browsing by Author "Thomas, S."