Browsing by Author "Tremouilles, David"

A novel method for guard ring efficiency assessment and its application for esd protection design and optimization

A plug-and-play wideband RF circuit ESD protection methodology: T-diodes

Advanced ESD power clamp design for SOI FinFET CMOS technology

Calibrated wafer-level HBM measurements for quasi-static and transient device analysis

Characterization and modeling of diodes in sub-45 nm CMOS technologies under HBM stress conditions

Characterization and optimization of sub-32nm FinFET devices for ESD applications

Design methodology for FinFET GG-NMOS ESD protecction devices

Design methodology of FinFET devices that meet IC-level HBM ESD targets

Different failure signatures of multiple TLP and HBM stresses in an ESD robust protection structure

Electrical and thermal scaling trends for SOI FinFET ESD design

Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs

Electrostatic discharges protection for emerging technologies and RF applications

ESD data analysis software

ESD protection for sub-45nm MugFET technology

Faster ESD device characterization with wafer-level HBM

Impact of CMOS Scaling and Technology Options on ESD Reliability

Methodology for design optimization of SOI FinFET grounded-gate NMOS devices

Next generation FinFET devices in bulk silicon technology and their benefits for ESD robustness

RF ESD protection strategies - the design and performance trade-off challenges

RFCMOS ESD protection and reliability