Browsing by Author "Tuomi, T."

Determination of crystal misorientation in epitaxial lateral overgrowth of GaN

Epitaxial laterial overgrowth of GaN on sapphire. An examination of epitaxy quality using synchrotron X-ray topography

Evaluation of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, Raman spectroscopy and electrical data

Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron x-ray topography, electrical data and Raman spectroscopy

Synchrotron x-ray topography studies of epitaxial laterial overgrowth of GaN on sapphire

White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN