Browsing by Author "Tyaginov, S. E."
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication A reliable method for the extraction of the lateral position of defects in ultra-scaled MOSFETs
Proceedings paper2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.XT.13Publication Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Proceedings paper2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.310-313Publication Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices
Journal article2017, Journal of Vacuum Science and Technology B, (35) 1, p.01A109