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Browsing by Author "Van Daele, B."

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    Effect of growth interrupt and growth rate on MOVPE-grown InGaN/GaN MQW structures

    Jacobs, K.
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    Van Daele, B.
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    Leys, Maarten
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    Moerman, Ingrid  
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    Van Tendeloo, G.
    Journal article
    2003, Journal of Crystal Growth, 248, p.498-502
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    Engineering of an insulating buffer and use of AIN interlayers: two optimisations for AlGaN-GaN HEMT-like structures

    Bougrioua, Z.
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    Moerman, Ingrid  
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    Nistor, L.
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    Van Daele, B.
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    Monroy, E.
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    Palacios, T.
    ;
    Calle, F.
    Journal article
    2003, Physica Status Solidi A, (195) 1, p.93-100
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    Formation of metallic In in InGaN/GaN multiquantum wells

    Van Daele, B.
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    Van Tendeloo, G.
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    Jacobs, Koen
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    Moerman, Ingrid  
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    Leys, Maarten
    Journal article
    2004, Applied Physics Letters, (85) 19, p.4379-4381
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    High electron mobility in AlGaN/GaN HEMT grown on sapphire: strain modification by means of AlN interlayers

    Germain, Marianne
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    Leys, Maarten
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    Boeykens, Steven
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    Degroote, Stefan
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    Wang, Wenfei  
    Proceedings paper
    2004-12, GaN and Related Alloys, 1/12/2003, p.341-346
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    Relation between microstructure and 2DEG properties in AlGaN/GaN structures

    Van Daele, B.
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    Van Tendeloo, G.
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    Germain, Marianne
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    Leys, Maarten
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    Bougrioua, Z.
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    Moerman, Ingrid  
    Meeting abstract
    2002, International Workshop on Nitride Semiconductors, 22/07/2002, p.315
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    Relation between microstructure and 2DEG properties of AlGaN/GaN structures

    Van Daele, B.
    ;
    Van Tendeloo, G.
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    Germain, Marianne
    ;
    Leys, Maarten
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    Bougrioua, Z.
    ;
    Moerman, Ingrid  
    Journal article
    2002, Physica Status Solidi B, (234) 3, p.830-834
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    Ripple morphologies on ion irradiated Si Ge

    Sarkar, Subhendu
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    Van Daele, B.
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    Vandervorst, Wilfried  
    Meeting abstract
    2007, SIMS XVI, 29/10/2007
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    Study of dopant diffusion and defect evolution for advanced ultra shallow junctions based on atomistic kinetic monte carlo approach

    Noda, T.
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    Vandervorst, Wilfried  
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    Felch, S.
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    Parihar, V.
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    Vrancken, Christa  
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    Severi, Simone  
    Proceedings paper
    2007, Extended Abstracts of the International Conference on Solid State Devices and Materials - SSDM, 18/09/2007, p.712-713
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    Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN

    Van Daele, B.
    ;
    Van Tendeloo, G.
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    Ruythooren, Wouter  
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    Derluyn, Joff
    ;
    Leys, Maarten
    Proceedings paper
    2005, Microscopy of Semiconducting Materials. Proceedings of the 14th Conference, 11/04/2005, p.389-392

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