imec Institutional Repository Browsing {{ collection }} by Author "Van Der Biest, O."

Publication

Assessment of quantitative characterization of localized strain using electron diffraction contrast imaging

Janssens, Koenraad

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Van Der Biest, O.

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Vanhellemont, Jan

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Maes, Herman

Journal article

1997, Ultramicroscopy, 69, p.151-167

Publication

Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation

Janssens, Koenraad

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Van Der Biest, O.

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Vanhellemont, Jan

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Maes, Herman

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Hull, R.

Journal article

1995, Appl. Phys. Lett., (67) 11, p.1530-3

Publication

Crystalline silicon thin-film solar cells on foreign substrates: the European project meteor

Gall, S.

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Schneider, J.

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Klein, J.

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Muske, M.

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Rau, B.

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Conrad, E.

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Sieber, I.

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Fuhs, W.

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Ornaghi, Carlo

Proceedings paper

2004, Proceedings of the 19th European photovoltaic Solar Energy Conference, 7/06/2004, p.475-478

Publication

Crystallisation and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films

Zhao, Chao

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Roebben, G.

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Heyns, Marc

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Van Der Biest, O.

Proceedings paper

2002, Euro Ceramics VII, 9/09/2001, p.1285-1288

Publication

Effect of crystallization ambient on orientation selection in Sol-Gel derived Pb(Zr,Ti)O-3 thin films on Pt electrode layers

Fè, Laura

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Vasiliu, Florin Dan

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Norga, Gerd

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Wouters, Dirk

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Van Der Biest, O.

Proceedings paper

2002, Euro Ceramics VII, Pt 1-3, 9/09/2002, p.1259-1262

Publication

Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure

Janssens, Koenraad

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Vanhellemont, Jan

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Maes, Herman

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Van Der Biest, O.

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Hull, R.

Proceedings paper

1995, Microscopy of Semiconducting Materials 1995. Proceedings, 20/03/1995, p.579-582

Publication

In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror

Roebben, G.

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Zhao, Chao

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Duan, R. G.

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Vleugels, J.

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Heyns, Marc

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Van Der Biest, O.

Proceedings paper

2002, Euro Ceramics VII, Pt 1-3, 9/09/2001, p.775-778

Publication

Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging

Janssens, Koenraad

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Van Der Biest, O.

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Vanhellemont, Jan

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Maes, Herman

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Hull, R.

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Bean, J. C.

Journal article

1995, Materials Science and Technology, (11) 1, p.66-71

Publication

Miscibility of amorphous ZrO2-Al2O3 binary alloy

Zhao, Chao

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Journal article

2002, Applied Physics Letters, (80) 13, p.2374-2376

Publication

Nanoscale strain characterization using transmission electron microscopy: The software package SIMCON

Janssens, Koenraad

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Van Der Biest, O.

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Vanhellemont, Jan

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Maes, Herman

Proceedings paper

1994, Proceedings of the 13th International Conference on Electron Microscopy - ICEM, 17/07/1994, p.997-998

Publication

Role of fluorite formation in orientation selection in sol-gel derived Pb(Zr,Ti)O3 films on Pt electrode layers

Norga, Gerd

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Fè, Laura

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Vasiliu, Florin Dan

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Wouters, Dirk

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Van Der Biest, O.

Proceedings paper

2002, Ferroelectric Thin Films X, 25/11/2001, p.15-20

Publication

Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited

Janssens, Koenraad

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Van Der Biest, O.

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Vanhellemont, Jan

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Maes, Herman

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Hull, R.

Oral presentation

1995, EMSA; August 1995;

Publication

Structural characterization of ALCVD ZrO2/Al2O3 nano-laminate deposits with high temperature grazing incidence XRD and TEM

Zhao, Chao

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Richard, Olivier

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Maes, Jos

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Roebben, G.

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Bender, Hugo

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De Gendt, Stefan

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Caymax, Matty

Oral presentation

2002, E-MRS Spring Meeting Symposium E: Advanced Characterisation of Semiconductor Materials and Devices

Publication

The effect of Pb stoichiometry on switching behavior of Pt/PZT/Pt ferroelectric capacitors

Norga, Gerd

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Maes, Jos

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Coppye, Erwin

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Fè, Laura

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Wouters, D.

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Van Der Biest, O.

Journal article

2000, Journal of Materials Research, (15) 11, p.2309-2313

Browsing by Author "Van Der Biest, O."