Browsing by Author "Van der Heyden, Nikolaas"
Now showing 1 - 4 of 4
- Results per page
- Sort Options
Publication A Dy2O3-capped HfO2 dielectric and TaCx-based metals enabling low-Vt single-metal-single-dielectric gate stack
Proceedings paper2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.535-538Publication Oxygen-vacancy-induced Vt shift in La-containing devices
Proceedings paper2007, Extended Abstracts of the International Conference on Solid State Devices and Materials - SSDM, 19/09/2007, p.372-373Publication Reliability study of La2O3 capped HfSiON high-permittivity n-type metal-oxide-semiconductor field-effect transistor devices with tantalum-rich electrodes
Journal article2008, Journal of Applied Physics, (104) 4, p.44500Publication Work function (WF) simulations of Ta/HfO2, Ta2C/HfO2 and Ta2C/La2O3/HfO2 capped high-k stacks
Proceedings paper2007, Physics and Technology of High-k Dielectrics, 7/10/2007, p.135-143