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Browsing by Author "Vandepitte, D."

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    Analytical thermo-mechanical model for non-underfilled area array flip chip assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
    ;
    Vandepitte, D.
    ;
    Baelmans, M.
    Journal article
    2004-09, Journal of Electronic Packaging, (126) 3, p.351-358
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    Influence of printed circuit board properties on solder joint fatigue life of assembled IC packages

    Vandevelde, Bart  
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    Gonzalez, Mario  
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    Beyne, Eric  
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    Vandepitte, D.
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    Baelmans, M.
    Proceedings paper
    2004, Proceedings European Microelectronics Packaging Symposium (IMAPS Europe), 16/06/2004, p.65-70
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    Modified micro-macro thermo-mechanical modelling of ceramic ball grid array packages

    Vandevelde, Bart  
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    Degryse, Dominiek
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    Beyne, Eric  
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    Roose, E.
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    Corlatan, D.
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    Swaelen, G.
    ;
    Willems, G.
    Journal article
    2003, Microelectronics Reliability, (43) 2, p.307-318
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    Parameter study for the reliability of underfilled flip chip and CSP assemblies

    Vandevelde, Bart  
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    Degryse, Dominiek
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    Beyne, Eric  
    ;
    Vandepitte, D.
    ;
    Baelmans, M.
    Proceedings paper
    2002, Proceedings of the European Microelectronics Packaging and Interconnection Symposium - IMAPS-EUROPE, 14/06/2002, p.130-135
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    Parameterised modelling of thermo-mechanical reliability for CSP assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
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    Zhang, K.G.Q.
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    Caers, J.
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    Vandepitte, D.
    ;
    Baelmans, M.
    Journal article
    2003, ASME Journal of Electronic Packaging, (125) 4, p.498-805
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    Semi-analytical model for calculation of induced strains in solder joints of underfilled flip chip assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
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    Vandepitte, D.
    ;
    Baelmans, M.
    Journal article
    2002, International Journal of Microcircuits and Electronic Packaging, (25) 3, p.264-278
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    Semi-analytical model for calculation of induced strains in solder joints of underfilled flip chip assemblies

    Vandevelde, Bart  
    ;
    Beyne, Eric  
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    Vandepitte, D.
    ;
    Baelmans, M.
    Proceedings paper
    2002, Proceedings of the 3rd Eurosime Conference, 14/04/2002, p.86-91
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    Solder parameter sensitivity for CSP life-time prediction using simulation-based optimisation method

    Vandevelde, Bart  
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    Beyne, Eric  
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    Zhang, K.G.Q.
    ;
    Caers, J.F.J.M.
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    Vandepitte, D.
    ;
    Baelmans, Martine
    Journal article
    2002, IEEE Trans. Electronics Packaging Manufacturing, (25) 4, p.318-325
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    Thermomechanical models for leadless solder interconnections in flip chip assemblies

    Vandevelde, Bart  
    ;
    Christiaens, Filip
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    Beyne, Eric  
    ;
    Roggen, Jean
    ;
    Peeters, J.
    ;
    Allaert, K.
    Journal article
    1998, IEEE Trans. Components, Packaging, and Manufacturing Technology. Part A, (21) 1, p.177-85

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