Browsing by Author "Verzellesi, G."
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Publication Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation
Journal article2015, Solid-State Electronics, 113, p.9-14Publication Effects of border traps on transfer curve hysteresis and split-CV mobility measurement in InGaAs quantum-well MOSFETs
Proceedings paper2016, Compound Semiconductor Week, 26/06/2016Publication Study of breakdown effects in silicon multiguard structures
;Da Rold, Martina ;Bacchetta, N. ;Bisello, D. ;Paccagnella, A. ;Dalla Betta, G. F.Verzellesi, G.Journal article1999, IEEE Trans. Nuclear Science, (46) 4, Pt.3, p.1215-1223