Browsing by Author "Vigar, David"
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Publication Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Publication Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Journal article2017, IEEE Transactions on Electron Devices, (64) 4, p.1467-1473Publication Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd