Browsing by Author "Wang, Peng Fei"
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Publication Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
Publication Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
; ; Reed, Robert A.Journal article2023, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (23) 1, p.153-161Publication Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices