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Browsing by Author "Wang, Teng"

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    3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement

    Wang, Teng
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    Bex, Pieter  
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    Capuz, Giovanni  
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    Duval, Fabrice  
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    Inoue, Fumihiro  
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    Gerets, Carine  
    Proceedings paper
    2016, IEEE 18th Electronic Packaging Technology Conference - EPTC, 30/11/2016, p.791-796
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    3D IC process development for enabling chip-on-chip and chip on wafer multi-stacking at assembly

    Daily, Robert
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    Capuz, Giovanni  
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    Wang, Teng
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    Bex, Pieter  
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    Struyf, Herbert  
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    Sleeckx, Erik  
    Meeting abstract
    2015, International Conference on Electronic Packaging & iMAPS All Asia Conference - ICEP-IACC, 14/04/2015, p.56-60
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    3D stacking induced mechanical stress effects

    Cherman, Vladimir  
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    Van der Plas, Geert  
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    De Vos, Joeri  
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    Ivankovic, Andrej
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    Lofrano, Melina  
    Proceedings paper
    2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.309-315
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    3D stacking of Co and Ni based microbumps

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Gerets, Carine  
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    Wang, Teng
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    Rebibis, Kenneth June  
    Proceedings paper
    2016, Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5
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    3D stacking using bump-less process for sub 10μm pitches

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Gerets, Carine  
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    Hou, Lin  
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    Heylen, Nancy  
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    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133
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    A novel in-situ resistance measurement to extract IMC resistivity and kinetic parameter for CoSn 3D stacks

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    De Coster, Jeroen  
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    Wang, Teng
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    Cherman, Vladimir  
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    Bex, Pieter  
    Proceedings paper
    2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.7.4
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    An alternative 3D packaging route thru wafer reconstruction

    Cadacio Jr., Francisco
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    Wang, Teng
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    Salahouelhadj, Abdellah  
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    Capuz, Giovanni  
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    Gerets, Carine  
    Proceedings paper
    2015, 17th Electronic Packaging Technology Conference - EPTC, 2/12/2015, p.1-5
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    Application of 3D X-ray microscopy for 3D IC process development

    Wang, Teng
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    De Wolf, Ingrid  
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    Gu, Allen
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    Estrada, Raleigh
    Proceedings paper
    2016, International Wafer Level Packaging Conference - IWLPC, 18/10/2016
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    Automated testing of bare die-to-die stacks

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    Wang, Teng
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    Fiedler, Jens
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    Kiesewetter, Joerg
    Proceedings paper
    2015-05, IEEE European Test Symposium - ETS, 25/05/2015
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    Automated testing of bare die-to-die stacks

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    Wang, Teng
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    Fiedler, Jens
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    Kiesewetter, Joerg
    Proceedings paper
    2015-07, TestVision 2020 Workshop, 15/07/2015, p.1-25
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    Automated testing of bare die-to-die stacks

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    Wang, Teng
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    Fiedler, Jens
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    Kiesewetter, Joerg
    Proceedings paper
    2015-10, IEEE International Test Conference - ITC, 6/10/2015, p.1-10
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    Automated testing of singulated die-to-die stacks

    Thiele, Frank
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    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    Wang, Teng
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    Fiedler, Jens
    Proceedings paper
    2015-09, COMPASS - Cascade Microtech User Meeting, 8/09/2015
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    Comparative study of 3D stacked IC and 3D interposer integration: processing and assembly challenges

    De Vos, Joeri  
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    Cherman, Vladimir  
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    Detalle, Mikael  
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    Wang, Teng
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    Salahouelhadj, Abdellah  
    Proceedings paper
    2014, IEEE 3D Sytem Integration Conference - 3DIC, 1/12/2014, p.1-7
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    Comparison of electrical properties of thermo-compression bonded 3D stacks using a liquid and a dry-film wafer level underfills

    Duval, Fabrice  
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    Wang, Teng
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    Capuz, Giovanni  
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    Gerets, Carine  
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    Miller, Andy  
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    Rebibis, Kenneth June  
    Meeting abstract
    2015, 17th Electronics Packaging Technology Conference - EPTC, 2/12/2015
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    Cost components for 3D system integration

    Velenis, Dimitrios  
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    Detalle, Mikael  
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    Van Huylenbroeck, Stefaan  
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    Jourdain, Anne  
    Proceedings paper
    2014, Electronics System-Integration Technology Conference - ESTC, 16/09/2014, p.1-5
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    Cu-Cu insertion bonding technique using photosensitive polymer as WLUF

    Potoms, Goedele  
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    Wang, Teng
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    Derakhshandeh, Jaber  
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    Daily, Robert
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    Capuz, Giovanni  
    Proceedings paper
    2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.313-317
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    Developing underfill process in screening of no-flow underfill and wafer-applied underfill materials for 3D stacking

    Rebibis, Kenneth June  
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    Capuz, Giovanni  
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    Daily, Robert
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    Gerets, Carine  
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    Duval, Fabrice  
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    Wang, Teng
    Proceedings paper
    2013, 15th Electronics Packaging Technology Conference - EPTC, 11/12/2013, p.124-129
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    Development and evaluation of photodefinable wafer level underfill

    Mitsukura, Kazuyuki
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    Saisyo, Ryouta
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    Makino, Tatsuya
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    Hatakeyama, Keiichi
    Journal article
    2015, Journal of Photopolymer Science and Technology, (28) 2, p.229-232
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    Development of multi-stack dielectric wafer bonding

    Peng, Lan  
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    Kim, Soon-Wook  
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    Inoue, Fumihiro  
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    Wang, Teng
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    Phommahaxay, Alain  
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    Verdonck, Patrick  
    Proceedings paper
    2016, 17th International Conference on Electronic Packaging Technology - ICEPT, 16/08/2016, p.22-25
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    Development of underfilling and thermo-compression bonding processes for stacking multi-layer 3D ICs

    Wang, Teng
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    Daily, Robert
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    Capuz, Giovanni  
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    Gerets, Carine  
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    Rebibis, Kenneth June  
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    Miller, Andy  
    Proceedings paper
    2014, 5th Electronics System-Integration Technology Conference - ESTC, 16/09/2014, p.1-5
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