Browsing by Author "Whall, T."

Now showing 1 - 3 of 3

Low-frequency noise characterizations of strained germanium pMOSFETs

Simoen, Eddy
;
Mitard, Jerome
;
De Jaeger, Brice
;
Eneman, Geert
;
Dobbie, A.
;
Myronov, M.
;
Whall, T.
Journal article
2011, IEEE Transactions on Electron Devices, (58) 9, p.3132-3139
TEM analysis of Ge-on-Si MOSFET structures with HfO2 dielectric for high performance PMOS device technology

Norris, D.J.
;
Walther, T.
;
Cullis, A.G.
;
Myronov, M.
;
Dobbie, A.
;
Whall, T.
;
Parker, E.H.C.
Journal article
2010, Journal of Physics Conference Series, (209) 1, p.12061
TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology

Norris, D.J.
;
Ross, I.M.
;
Cullis, A.G.
;
Walther, T.
;
Myronov, M.
;
Dobbie, A.
;
Whall, T.
Journal article
2010, Journal of Physics Conference Series, (241) 1, p.12044