Browsing by Author "Wortman, J. J."
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Publication A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides
Publication Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
Publication Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFETs