Browsing by Author "Wouters, Lennaert"
- Results per page
- Sort Options
Publication 3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors
Proceedings paper2019, IEEE International Electron Devices Meeting - IEDM 2019, 7/12/2019, p.238-241Publication Advanced Current-Voltage Model of Electrical Contacts to GaAs- and Ge-Based Active Silicon Photonic Devices
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 8, p.4274-4279Publication Apparent size effects on dopant activation in nanometer-wide Si fins
Journal article2021, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, (39) 2, p.Art. 023202Publication Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques
Oral presentation2021, MRS Spring 2021Publication Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Journal article2020, Park Systems.com: Application Note #54, p.1-5Publication Combining TCAD and advanced metrology techniques to support device integration towards N3
Proceedings paper2021, 20th International Workshop on Junction Technology (IWJT), JUN 10-11, 2021, p.84-87Publication Electrical properties of extended defects in strain relaxed GeSn
Journal article2018, Applied Physics Letters, (113) 2, p.22102Publication Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy
Journal article2024, MICRO AND NANO ENGINEERING, (23) June, p.Art. 100247Publication Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices
Journal article2018, Japanese Journal of Applied Physics, (57) 4S, p.04FN01Publication Hedgehog probe tips enabling high-resolution scanning probe microscopy
Meeting abstract2019, 21st International Scanning Probe Microscopy (ISPM) Conference, 26/05/2019Publication Integration of interconnected magnetic tunnel junctions for spin torque majority gates
Proceedings paper2017, 49th International Conferece on Solid State Devices and Materials - SSDM, 19/09/2017Publication Local Enhancement of Dopant Diffusion from Polycrystalline Silicon Passivating Contacts
Journal article2022, ACS APPLIED MATERIALS & INTERFACES, (14) 15, p.17975-17986Publication Mapping conductance and carrier distributions in confined three-dimensional transistor structures
Book chapter2019Publication Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM
Meeting abstract2018, Materials Research Society Spring Meeting 2018, 2/04/2018, p.CM01.09.02Publication Oil as an Enabler for Efficient Materials Removal in Three-Dimensional Scanning Probe Microscopy Applications
Journal article2021-12, FRONTIERS IN MECHANICAL ENGINEERING-SWITZERLAND, (7) 797962, p.1-8Publication Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements
Journal article2024, NANOTECHNOLOGY, (35) 26, p.Art. 265703Publication Reverse tip sample scanning for precise and high-throughput electrical characterization of advanced nodes
Proceedings paper2019, IEEE International Electron Devices Meeting - IEDM 2019, 7/12/2019, p.90-93Publication Self-patterned ultra-sharp diamond tips and their application for advanced nanoelectronics device characterization by electrical SPM
Journal article2023, MICRO AND NANO ENGINEERING, (19) June, p.Art. 100195Publication Understanding the kinetics of Metal Induced Lateral Crystallization process to enhance the poly-Si channel quality and current conduction in 3-D NAND memory
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021Publication Understanding tip-induced nanoscale wear for tomographic atomic force microscopy
Meeting abstract2019, AVS 66th International Symposium & Exhibition, 20/10/2019, p.NS-ThP8