Browsing by Author "Wouters, Lennaert"

3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors

Accessing electronic properties of two-dimensional materials with gate-dependent micro four-point probe

Advanced Current-Voltage Model of Electrical Contacts to GaAs- and Ge-Based Active Silicon Photonic Devices

Apparent size effects on dopant activation in nanometer-wide Si fins

Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques

Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

Combining TCAD and advanced metrology techniques to support device integration towards N3

Electrical properties of extended defects in strain relaxed GeSn

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy

Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices

Hedgehog probe tips enabling high-resolution scanning probe microscopy

High-resolution Scanning Spreading Resistance Microscopy (SSRM) for carrier mapping in nanoscale gate‑all‑around (GAA) transistors

Integration of interconnected magnetic tunnel junctions for spin torque majority gates

Leveraging Artificial Intelligence and Reverse Tip Sample Configuration for Automation of Data Processing in Quantitative Scanning Spreading Resistance Microscopy

Local Enhancement of Dopant Diffusion from Polycrystalline Silicon Passivating Contacts

Mapping conductance and carrier distributions in confined three-dimensional transistor structures

Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM

Nanofabrication of sharp conductive diamond tip probe chips and their application in reverse tip sample scanning probe microscopy

Oil as an Enabler for Efficient Materials Removal in Three-Dimensional Scanning Probe Microscopy Applications

Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements