Browsing by Author "Zorian, Yervant"
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Publication Guest editorial: Special issue on testing of 3D stacked integrated circuits
; Zorian, YervantJournal article2012-02, Journal of Electronic Testing, (28) 1, p.13-14Publication Guest editors introduction: the status of IEEE Std 1500 - Part 2
; Zorian, YervantJournal article2009, IEEE Design & Test of Computers, (26) 3, p.4-4Publication Guest editors' introduction: The status of IEEE Std 1500
; Zorian, YervantJournal article2009, IEEE Design & Test of Computers, (26) 1, p.6-7Publication IEEE 1500 enables modular SOC testing
; Zorian, YervantJournal article2009, IEEE Design & Test of Computers, (26) 1, p.8-16Publication IoT: Source of test challenges
Proceedings paper2016-05, 21th IEEE European Test Symposium - ETS, 23/05/2016, p.1-10Publication Testing 3D chips containing through-silicon vias
; Zorian, YervantProceedings paper2009, IEEE International Test Conference - ITC, 1/11/2009