Browsing by author "Eyben, Pierre"
Now showing items 61-80 of 217
-
Development of a dedicated software for the quantification of two-dimensional high vacuum scanning spreading resistance microscopy measurements
Eyben, Pierre; Clarysse, Trudo; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2012) -
Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology
Hantschel, Thomas; Cott, Daire; Palanne, Saku; Richard, Olivier; Arstila, Kai; Verhulst, Anne; Schulz, Volker; Eyben, Pierre; Vandervorst, Wilfried (2008) -
Diameter-dependent boron diffusion in silicon nanowire-based transistors
Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2013) -
Diamond nanoprobes for electrical probing of nanoelectronics device structures
Hantschel, Thomas; Clarysse, Trudo; Nuytten, Thomas; Paredis, Kristof; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Diamond tips for automated electrical probing inside a scanning electron microscopy system
Hantschel, Thomas; Arstila, Kai; Olantera, Lauri; Schulze, Andreas; Werner, Thilo; Eyben, Pierre; Clarysse, Trudo; Vandervorst, Wilfried (2011) -
Diamond tips for electrical AFM measurements with sub-nanometer resolution
Hantschel, Thomas; Tsigkourakos, Menelaos; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Schulze, Andreas; Vandervorst, Wilfried (2014) -
Diamond tips for electrical probing on the nanometer scale
Hantschel, Thomas; Arstila, Kai; Schulze, Andreas; Eyben, Pierre; Tsigkourakos, Menelaos; Vandervorst, Wilfried (2011) -
Diffusion-less junctions and super halo profiles for PMOS transistors formed by SPER and FUSI gate in 45 nm physical gate length devices
Severi, Simone; Kottantharayil, Anil; Pawlak, Bartek; Duffy, Ray; Henson, K.; Lindsay, R.; Lauwers, Anne; Veloso, Anabela; de Marneffe, Jean-Francois; Ramos, Javier; Sijmus, Bram; Devriendt, Katia; Camillo-Castillo, A.; Eyben, Pierre; Vandervorst, Wilfried; Jurczak, Gosia; Biesemans, Serge; De Meyer, Kristin (2004) -
Direct measurement of semiconductors surface states parameters using Kelvin probe force microscopy
Rosenwaks, Y.; Saraf, S.; Eyben, Pierre; Vandervorst, Wilfried (2003) -
Dopant and carrier profiling for 3D-device architectures
Mody, Jay; Kambham, Ajay Kumar; Zschaetzsch, Gerd; Chiarella, Thomas; Collaert, Nadine; Witters, Liesbeth; Eyben, Pierre; Gilbert, Matthieu; Koelling, Sebastian; Schulze, Andreas; Hoffmann, Thomas Y.; Vandervorst, Wilfried (2011) -
Dopant and carrier profiling in FinFET-based devices with sub-nanometer resolution
Mody, Jay; Kambham, Ajay Kumar; Zschaetzsch, Gerd; Schatzer, Philipp; Chiarella, Thomas; Collaert, Nadine; Witters, Liesbeth; Jurczak, Gosia; Horiguchi, Naoto; Gilbert, Matthieu; Eyben, Pierre; Koelling, Sebastian; Schulze, Andreas; Hoffmann, Thomas Y.; Vandervorst, Wilfried (2010) -
Dopant/carrier profiling for 3D-structures
Vandervorst, Wilfried; Schulze, Andreas; Kambham, Ajay Kumar; Mody, Jay; Gilbert, Matthieu; Eyben, Pierre (2014) -
Dopant/carrier profiling for sub-45nm technologies
Vandervorst, Wilfried; Janssens, Tom; Eyben, Pierre; Duriau, Edouard (2005) -
Dopant/carrier profiling in nanostructures
Vandervorst, Wilfried; Eyben, Pierre; Schulze, Andreas; Mody, Jay; Koelling, Sebastian; Kambham, Ajay Kumar; Gilbert, Matthieu (2010) -
Dopant/carrier profiling in non-planar or textured structures
Vandervorst, Wilfried; Douhard, Bastien; Eyben, Pierre; Seidel, F.; Hantschel, Thomas (2010) -
Effect of amorphization on activation and deactivation of boron in source/drain, channel and poly gate
Pawlak, Bartek; Duffy, Ray; Janssens, Tom; Vandervorst, Wilfried; Severi, Simone; Richard, Olivier; Benedetti, Alessandro; Eyben, Pierre; Colombeau, B.; Cowern, N.E.B.; Camillo-Castillo, R.A.; Jones, K.S.; Aboy, M. (2005) -
Electrical characterization of carbon nanotube based interconnects
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Dathe, Andre; Nazir, Aftab; Mody, Jay; Celano, Umberto; Ke, Xiaoxing; Vandervorst, Wilfried (2011) -
Electrical properties of amino SAM layers studied with conductive AFM
Chintala, Ravi Chandra; Eyben, Pierre; Armini, Silvia; Maestre Caro, Arantxa; Loyo Prado, Jana; Sun, Yiting; Vandervorst, Wilfried (2013) -
Electrical properties of APTMS SAM layers studied with conductive atomic force microscope
Chintala, Ravi Chandra; Eyben, Pierre; Vandervorst, Wilfried; Armini, Silvia; Sun, Yiting (2012) -
Electrical scanning probe techniques in semiconductor research
Trenkler, Thomas; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Stephenson, Robert; Hantschel, Thomas; Vandervorst, Wilfried (1999)