Browsing by author "Snauwaerts, Jan"
Now showing items 1-8 of 8
-
Carrier Distribution in Silicon Devices by Atomic Force Microscopy on Etched Surfaces
Raineri, Vito; Privitera, Vittorio; Vandervorst, Wilfried; Hellemans, L.; Snauwaerts, Jan (1994) -
Carrier Profile Determination in Device Structures using AFM-Based Methods
Vandervorst, Wilfried; De Wolf, Peter; Clarysse, Trudo; Trenkler, Thomas; Hellemans, L.; Snauwaerts, Jan; Raineri, Vito (1995) -
Characterization of a point-contact on silicon using force microscopy-supported resistance measurements
De Wolf, Peter; Snauwaerts, Jan; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1995) -
Lateral and Vertical Dopant Profiling in Semiconductors by Atomic Force Microscopy Using Conducting Tips
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaerts, Jan (1994) -
Local potential measurements in silicon devices using atomic force microscopy with conductive tips
Trenkler, Thomas; De Wolf, Peter; Snauwaerts, Jan; Qamhieh, Z.; Vandervorst, Wilfried; Hellemans, L. (1995) -
Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling
Snauwaerts, Jan; Blanc, N.; De Wolf, Peter; Hellemans, L. (1995) -
On the Determination of Two-Dimensional Carrier Distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Privitera, Vittorio; Raineri, Vito; Hellemans, L.; Snauwaerts, Jan (1994) -
Quantitative carrier profiling of silicon devices by nano-srp
De Wolf, Peter; Clarysse, Trudo; Caymax, Matty; Vandervorst, Wilfried; Snauwaerts, Jan; Hellemans, L. (1996)