Browsing by author "Zuber, Paul"
Now showing items 1-20 of 36
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A holistic approach for statistical analysis of SRAM
Zuber, Paul; Dobrovolny, Petr; Miranda Corbalan, Miguel (2010) -
Atomistic approach to variability of bias-temperature instability in circuit simulations
Kaczer, Ben; Mahato, Swaraj; Valduga de Almeida Camargo, Vinicius; Toledano Luque, Maria; Roussel, Philippe; Grasser, Tibor; Catthoor, Francky; Dobrovolny, Petr; Zuber, Paul; Wirth, Gilson; Groeseneken, Guido (2011-04) -
Circuit and product level assessment of emerging fully depleted channel devices: FinFET and UTBOX-SOI
Badaroglu, Mustafa; Dehan, Morin; Garcia Bardon, Marie; Miranda Corbalan, Miguel; Zuber, Paul; Schuddinck, Pieter; Mallik, Arindam; Mercha, Abdelkarim; Verkest, Diederik (2012) -
Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Martin-Martinez, Javier; Kaczer, Ben; Boix, J.; Ayala, N.; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, X.; Zuber, Paul; Dierickx, Bart; Groeseneken, Guido (2009-02) -
Circuit-level modeling of Finfet sub-threshold slope and DIBL mismatch beyond 22nm
Royer Del Barrio, Pablo; Zuber, Paul; Cheng, Binjie; Asenov, Asen; Lopez-Vallejo, M. (2013) -
Device to product level assessment of process variability
Miranda Corbalan, Miguel; Dobrovolny, Petr; Zuber, Paul; Roussel, Philippe (2011) -
Digital circuit design and benchmarking for FDSOI devices: FinFET and UTBOX
Badaroglu, Mustafa; Zuber, Paul; Garcia Bardon, Marie; Miranda Corbalan, Miguel; Schuddinck, Pieter; Mercha, Abdelkarim (2012) -
Impact of Fin height variations on SRAM yield
Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel; Garcia Bardon, Marie; Chiarella, Thomas; Buchegger, Peter; Mercha, Abdelkarim; Verkest, Diederik; Steegen, An; Horiguchi, Naoto (2012-04) -
Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
Griffoni, Alessio; Zuber, Paul; Dobrovolny, Petr; Roussel, Philippe; Linten, Dimitri; Alles, Michael L.; Schrimpf, Ronald D.; Reed, Robert A.; Kobayashi, Daisuke; Simoen, Eddy; Groeseneken, Guido (2011) -
Logic scaling assessment in 20nm and beyond under electrical and litho constraints
Badaroglu, Mustafa; Garcia Bardon, Marie; Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel (2012) -
Memory wide statistical analysis for robust SRAM design – Part I: what and why
Zuber, Paul; Dobrovolny, Petr; Miranda Corbalan, Miguel (2010) -
New tools and methods in robust SRAM design
Zuber, Paul; Miranda Corbalan, Miguel; Dobrovolny, Petr (2011) -
Opportunities for system level technology assessment
Zuber, Paul; Dobrovolny, Petr; Christie, Phillip (2013) -
Postponing SoC death
AbdelHamid, Ahmed; Anchlia, Ankur; Dierickx, Bart; Miranda Corbalan, Miguel; Zuber, Paul (2008) -
SRAM cell architecture in 20nm and beyond: bulk planar versus bulk finFET
Dobrovolny, Petr; De Bisschop, Peter; Miranda Corbalan, Miguel; Zuber, Paul; Cosemans, Stefan; Mallik, Arindam; Van de Kerkhove, Jeroen (2012) -
SRAM scalability assessment in view of variability: a technology perspective
Miranda Corbalan, Miguel; Zuber, Paul; Garcia Bardon, Marie; Royer Del Barrio, Pablo (2012) -
Statistical analysis for robust SRAM design
Miranda Corbalan, Miguel; Zuber, Paul; Dobrovolny, Petr; van der Zanden, Koen (2009) -
Statistical characterization of a high-K metal gate 32nm ARM926 core under process variability impact
Zuber, Paul; Dobrovolny, Petr; Laabidi, Selma; Javerliac, Virgile; Laplanche, Yves; Miranda Corbalan, Miguel (2011) -
Statistical memory analysis for robust SRAM design – part II
Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel (2010) -
Statistical SRAM analysis for yield enhancement
Zuber, Paul; Miranda Corbalan, Miguel; Dobrovolny, Petr; van der Zanden, Koen; Jung, Jong-Hoon (2010)