Browsing by author "Huet, Karim"
Now showing items 1-8 of 8
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3D simulation for melt laser anneal integration in FinFET's contact
Tabata, Toshiyuki; Curvers, Benoit; Huet, Karim; Chew, Soon Aik; Everaert, Jean-Luc; Horiguchi, Naoto (2020) -
Analysis of performance/variability trade-off in Macaroni-type 3-D NAND Memory
Congedo, Gabriele; Arreghini, Antonio; Liu, Lifang; Capogreco, Elena; Lisoni, Judit; Huet, Karim; Toque-Tresonne, Ines; Van Aerde, Steven; Toledano Luque, Maria; Tan, Chi Lim; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Evaluation of backside passivation using laser annealing in backside illuminated image sensors
Minoglou, Kiki; De Munck, Koen; Malachowski, Karl; Sabuncuoglu Tezcan, Deniz; Everaert, Jean-Luc; Haspeslagh, Luc; Mazzamuto, Fulvio; Toqué-Trésonne, Ines; Huet, Karim; De Moor, Piet (2013) -
Laser thermal anneal of polysilicon channel to boost 3D memory performance
Lisoni, Judit; Arreghini, Antonio; Congedo, Gabriele; Toledano Luque, Maria; Toqué-Trésonne, Inès; Huet, Karim; Capogreco, Elena; Liu, Lifang; Tan, Chi Lim; Degraeve, Robin; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Nickel silicide contacts formed by excimer laser annealing for high efficiency solar cells
Tous, Loic; Lerat, Jean-Francois; Emeraud, Thierry; Negru, Razgan; Huet, Karim; Uruena De Castro, Angel; Aleman, Monica; Meersschaut, Johan; Bender, Hugo; Russell, Richard; John, Joachim; Poortmans, Jef; Mertens, Robert (2013) -
Progress in nickel silicide formation using excimer laser annealing: a simulation study
Lerat, Jean-Francois; Tous, Loic; Negru, Razvan; Huet, Karim; Emeraud, Thierry; John, Joachim; Poortmans, Jef; Mertens, Robert (2012) -
Progress in nickel silicide formation using excimer laser thermal annealing
Tous, Loic; Lerat, Jean-Francois; Emeraud, Thierry; Negru, R.; Huet, Karim; Russell, Richard; John, Joachim; Poortmans, Jef; Mertens, Robert (2012) -
Segregation and activation of Sb implanted in Si by UV nanosecond-laser-anneal-induced non-equillibrium solidification
Tabata, Toshiyuki; Raynal, Pierre-Edouard; Huet, Karim; Everaert, Jean-Luc (2020)