Browsing by author "Mieville, Jean-Paul"
Now showing items 1-5 of 5
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An optimized poly-buffered LOCOS process for a 0.35 µm CMOS technology
Mieville, Jean-Paul; Rooyackers, Rita; Deferm, Ludo (1994) -
Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.; Deferm, Ludo (1995) -
FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
Mieville, Jean-Paul; Van den Bosch, Geert; Deferm, Ludo; Bellens, Rudi; Groeseneken, Guido; Maes, Herman; Schoenmaker, Wim (1994) -
Performance and reliability aspects of FOND: A new deep submicron CMOS device concept
Bellens, Rudi; Van den Bosch, Geert; Habas, Predrag; Mieville, Jean-Paul; Badenes, Gonçal; Clerix, Andre; Groeseneken, Guido; Deferm, Ludo; Maes, Herman (1996) -
Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G. (1995)