Browsing by author "Hurkx, Fred"
Now showing items 1-6 of 6
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A fast and reliable method used to investigate the size-dependent retention lifetime of a phase-change line cell
Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus (2011) -
A novel method for extracting the temperature-dependent crystal-growth parameters in fast-growth phase-change memories
Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus (2010) -
Degradation of the reset switching during endurance testing of a phase-change line cell
Goux, Ludovic; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; Attenborough, Karen; Wouters, Dirk (2009) -
Evidence of the prominent role of the time-under-melt parameter in the reset switching of phase-change line cells
Goux, Ludovic; Gille, Thomas; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; De Meyer, Kristin; Attenborough, Karen; Wouters, Dirk (2008) -
Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method
Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus (2010) -
Transient characteristics of the reset programming of a phase-change line cell and the effect of the reset parameters on the obtained state
Goux, Ludovic; Gille, Thomas; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk J.; De Meyer, Kristin; Attenborough, Karen; Wouters, Dirk (2009)