Browsing by author "Carin, R."
Now showing items 1-17 of 17
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Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.-M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2011) -
DC and noise performances of SOI FinFETs at very low temperature
Achour, H.; Talmat, R.; Cretu, B.; Routoure, J.M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2012) -
High-temperature characterization of advanced strained nMUGFETs
Talmat, Rachida; Put, Sofie; Collaert, Nadine; Mercha, Abdelkarim; Claeys, Cor; Guo, W.; Cretu, B.; Benfdila, A.; Routoure, J.-M.; Carin, R.; Simoen, Eddy (2010) -
Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Routoure, J.M.; Guo, W.; Cretu, B.; Lartigau, I.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2008) -
Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
Achour, H.; Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Benfdila, A.; Aoulaiche, Marc; Claeys, Cor (2015) -
Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
Guo, Wei; Cretu, B.; Routoure, J.-M.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Put, Sofie; Claeys, Cor (2008) -
Low frequency noise characterization in n-channel FinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.-M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2012) -
Low frequency noise spectroscopy in advanced nFinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2011) -
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Lartigau, I.; Routoure, J.M.; Guo, W.; Cretu, B.; Carin, R.; Mercha, Abdelkarim; Claeys, Cor; Simoen, Eddy (2007) -
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator MOSFETs
Lartigau, I.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2003) -
Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
Guo, Wei; Nicholas, Gareth; Kaczer, Ben; Todi, Ravi; De Jaeger, Brice; Claeys, Cor; Mercha, Abdelkarim; Simoen, Eddy; Cretu, B.; Routoure, J.M.; Carin, R. (2007) -
Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Guo, W.; Talmat, R.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2009) -
Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
Pichon, L.; Mercha, Abdelkarim; Routoure, J. M.; Carin, R.; Bonnaud, O.; Mohammed-Brahim, T. (2002) -
Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs
Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Aoulaiche, Marc; Claeys, Cor (2015) -
Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Simoen, Eddy; Claeys, Cor (2007) -
Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniques
Guo, Wei; Routoure, J.M.; Cretu, B.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Put, Sofie; Claeys, Cor (2008)