Browsing by author "Smith, Ken"
Now showing items 1-11 of 11
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A full-automatic test system for characterizing wide-I/O micro-bump probe cards
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Hill, Eric; Smith, Ken (2017-06) -
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Hill, Eric; Smith, Ken (2017-09) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10) -
Evaluation of advanced probe cards for large-array fine-pitch micro-bumps
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Smith, Ken; Hill, Eric (2017-11) -
Evaluation of TSV and micro-bump probing for wide I/O testing
Smith, Ken; Hanaway, Peter; Jolley, Mike; Gleason, Reed; Strid, Eric; Daenen, Tom; Dupas, Luc; Knuts, Bruno; Marinissen, Erik Jan; Van Dievel, Marc (2011-09) -
Pre-Bond Testing Through Direct Probing of Large-Array Fine-Pitch Micro-Bumps
Marinissen, Erik Jan; De Wachter, Bart; Kiesewetter, Joerg; Smith, Ken (2019-03) -
Probing 25μm-diameter micro-bumps for Wide-I/O 3D SICs
Smith, Ken; Marinissen, Erik Jan (2014) -
Probing of large-array, fine-pitch microbumps for 3D ICs
Fodor, Ferenc; De Wachter, Bart; Marinissen, Erik Jan; Kiesewetter, Joerg; Smith, Ken (2017-05) -
Test strategies for wide-I/O memory, 3D-TSV technology test vehicles and ultra-fine-pitch applications
Smith, Ken; Bock, Daniel; Gleeson, Read; Jolley, Mike; Marinissen, Erik Jan (2012-11) -
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Marinissen, Erik Jan; Daenen, Tom; Dupas, Luc; Van Dievel, Marc; Hanaway, Peter; Kiesewetter, Joerg; Smith, Ken; Strid, Eric; Thaerigen, Thomas (2011)